Multiprobe measurement device and method

ABSTRACT

A measuring system for measuring signals with multiple measurement probes includes a multi probe measurement device having at least two probe interfaces that each couple the multi probe measurement device with at least one of the measurement probes, a data interface that couples the multi probe measurement device to a measurement data receiver, and a processing unit coupled to the at least two probe interfaces that records measurement values via the at least two probe interfaces from the measurement probes. The processing unit is further coupled to the data interface and provides the recorded measurement values to the measurement data receiver that also includes a data interface. The data interface of the measurement data receiver is coupled to the data interface of the multi probe measurement device.

TECHNICAL FIELD

The present invention relates to a measuring system and a respectivemethod.

BACKGROUND

Although applicable in principal to any measurement system, the presentinvention and its underlying problem will be hereinafter described incombination with oscilloscopes.

Modern oscilloscopes usually comprise a number of analog input channelsthat each comprise a high quality high speed analog-to-digital converterfor converting analog signals into digital signals for further analysis.Such analog signals may be in the GHz range. The analog-to-digitalconverters are therefore optimized for high speed signal acquisition.

In modern electronics it may however not be sufficient to analyze thehigh frequency analog signals in a device under test. It may also berequired to analyze the behavior of the digital device under test underdifferent environmental conditions.

Such measurements are however difficult to implement with oscilloscopesand usually include performing separate measurements of the signals inthe device under test and any environmental variables. The measuredvalues may then e.g. be compared offline, e.g. on a computer.

Against this background, the problem addressed by the present inventionis providing an improved measurement for devices under test undervarying environmental conditions.

SUMMARY

The present invention solves this object by a measuring system with thefeatures of claim 1, and a method with the features of claim 17.

Accordingly it is Provided:

A measuring system for measuring signals with multiple measurementprobes comprises a multi probe measurement device that comprising atleast two probe interfaces that each couple the multi probe measurementdevice with at least one of the measurement probes, a data interfacethat couples the multi probe measurement device to a measurement datareceiver, and a processing unit coupled to the at least two probeinterfaces that records measurement values via the at least two probeinterfaces from the measurement probes, wherein the processing unit isfurther coupled to the data interface and provides the recordedmeasurement values to the measurement data receiver, and a measurementdata receiver comprising a data interface, wherein the data interface ofthe measurement data receiver is coupled to the data interface of themulti probe measurement device.

In addition, it is provided:

A method for measuring electrical signals, the method comprisingcoupling a multi probe measurement device to a measurement data receiverwith analog measurement channels via a data interface, connecting atleast one measurement probe to the multi probe measurement device,measuring analog signals with the measurement data receiver, recordingmeasurement values with the multi probe measurement device, andproviding the recorded measurement values from the multi probemeasurement device to the measurement data receiver via the datainterface.

Modern electronics require a plurality of different measurements andqualification procedures during development or servicing. The presentinvention is based on the finding that recording only analog signalswith an oscilloscope may not suffice to detect systematic errors thatdepend on other physical parameters, like e.g. a temperature.

The present invention therefore provides the multi probe measurementdevice. The multi probe measurement device comprises probe interfacesthat couple different measurement probes to the multi probe measurementdevice.

Possible measurement probes may e.g. comprise temperature sensors,acceleration sensors, light intensity sensors, color sensors, viscositysensors for liquids and gas sensors. It is understood, that any othertype of sensor may also be used.

In general the values measured by the measurement probes may be seen asslow changing compared to signals that are usually measured withoscilloscopes and may comprise frequencies in the GHz range.

In the multi probe measurement, device the processing unit recordsmeasurement values from the measurement probes and transmits themeasurement values via the data interface to a measurement device, e.g.the measurement data receiver.

In a measuring system the measurement data receiver, e.g. anoscilloscope, may receive the measurement values from the measurementprobes via the multi probe measurement device. It is understood, thatthe measurement data receiver may at the same time record signals viaanalog input channels.

The present invention therefore allows analyzing the values measured bythe measurement probes together with the analog signals measured via theanalog channels of the measurement data receiver to perform an in depthanalysis of the respective device under test.

It is for example possible to detect and analyze droop effects inamplifiers that are mainly temperature induced. A temperature rise inthe amplifier may e.g. be caused by a voltage rise at the inputs. Itwill take the amplifier some time to reach the final temperature leadingto the so called droop, a shift of the amplification. The possibility toanalyze the behavior of an amplifier during temperature changes mayprovide valuable information for optimization of the amplifier.

Another exemplary application is in housings of electronic devices,where a running speed of a cooling fan is adapted to the temperature inthe housing. The fan may be provided with an acceleration or revolutionsensor as measurement probes. The developer may then e.g. analyze ifproviding the fan electronics with input signals, e.g. PWM inputsignals, results in the required revolutions. It is further possible toanalyze if the fan works properly over the full temperature range. Ifthe fan speed drops at certain temperatures, it is possible to analyzeinternal signals of the fan electronics at the specific temperatures.With additional temperature sensors, it is further possible to analyzethe thermal inertia of the full system, i.e. the housing with theintegrated electronic devices.

In another example, a temperature range may be defined for an electronicdevice, e.g. a GPS navigation system. If during development of theelectronic device defects are detected at certain temperatures withinthe temperature range, it is possible to fully analyze the internaldetails of the electronic device in view of the measured temperatures.

Another example comprises a mobile device, like e.g. a smartphone thatmay activate safety mechanisms if it detects that it is falling. Duringdevelopment of the mobile device it is possible with the presentinvention to measure the acceleration of the mobile device via ameasurement probe and at the same time analyze internal signals of themobile device. This allows determining if the correct safety mechanismsare activated for the respective accelerations.

In another example, a power supply may e.g. fail at elevated moisturelevels. In this case a measurement probe may be provided for measuringthe moisture level. The internal signals of the power supply may then beanalyzed with the analog channels of the measurement data receiver.

Another example involves solar powered devices, like e.g. solar poweredwrist watches. With the present invention measurement probes may measurethe incident light, and the analog channels of the measurement datareceiver may measure internal values of the solar powered device. Thisallows analyzing in detail the behavior, like e.g. stability and batterylife, of the electronics in the solar powered device under differentlight conditions.

A further example refers to filling machines, e.g. for beverages orchemicals. It must e.g. be made sure that the valves of the fillingmachine are closed if the viscosity of the transported liquid is toohigh or that the filling quantity, e.g. of chemicals or flavorings, isexactly controlled. In such an application flow sensors may be used asmeasurement probes and the internal signals of the controller of thefilling machine may be analyzed with the analog channels of themeasurement data receiver.

It is understood, that many other applications are possible and theabove examples are only presented for better understanding of thepresent invention.

It is a common detail to all the above examples that the parameters thatare measured via the measurement probes change relatively slow comparedto the signal values that may be measured via the analog channels of themeasurement data receiver.

With the multi probe measurement device in combination with a commonmeasurement data receiver it is therefore possible to perform a timelyaligned or correlated analysis of internal signals of an electronicsystem with external parameters, like the above mentioned.

It is further understood, that the multi probe measurement device mayalso be used with other devices than measurement data receivers. It isfor example possible to couple the multi probe measurement device to acomputer. Such a computer may further receive the measurement valuesfrom a measurement data receiver and then perform the combined analysis.

It is further understood, that the multi probe measurement device maye.g. comprise a user interface, like e.g. a display to provide statusinformation to the user, or input buttons to allow a user to configurethe multi probe measurement device. The user interface may e.g. comprisea LCD display, a touchscreen, a keyboard and the like.

Further embodiments of the present invention are subject of the furthersubclaims and of the following description, referring to the drawings.

In a possible embodiment, the multi probe measurement device maycomprise a timer coupled to the processing unit, wherein the processingunit may be configured to provide the recorded measurement values with atime stamp.

The timer may e.g. be a real time clock device or a high precisiontimer, like the high precision event timer in modern computers. Thetimer may e.g. be provided as a dedicated device or may be integrated asa logic section in the processing unit.

Such a timer may provide an absolute or a relative time to theprocessing unit. The processing unit may then provide the singlemeasurement values of the measurement probes with respective timestamps. The receiver of the recorded measurement values may then use thetime stamps to timely align the measurement values received from themulti probe measurement device with other measurement values.

It is understood, that as alternative or in addition to the timer, themulti probe measurement device, e.g. the processing unit, may receive atrigger or event message via the data interface. The multi probemeasurement device may upon reception of the trigger message startcontinuously streaming the recorded measurement values to the devicethat is connected to the data interface. The device that is connected tothe data interface may e.g. know the signal delay until it receives themeasurement values and may then perform the time alignment of therecorded measurement values with the locally measured signals. Asalternative, the multi probe measurement device may provide its internalsignal delay via the data interface to the respective device, e.g. themeasurement data receiver.

In a possible embodiment, the processing unit may be configured toreceive a synchronization message via the data interface and configurethe timer according to the synchronization message.

The device that is connected to the data interface, e.g. theoscilloscope, may be seen as a kind of master or managing node in themeasuring system. This device may therefore provide the synchronizationmessage such that e.g. the processing unit may configure the timeraccordingly. This will put the timer of the multi probe measurementdevice in synchronization with the timer in the device that is connectedto the data interface. The time stamps that the processing unitgenerates for the single measurement values will therefore directlycorrespond to the local time in the device that is connected to the datainterface.

In a possible embodiment, the at least two probe interfaces may comprisea wired digital data interface, especially a USB interface and/or a LANinterface and/or a CAN interface and/or a CAN-FD interface and/or a LINinterface and/or a FlexRay interface and/or an I2C interface and/or aSENT interface, and/or wherein the at least two probe interfacescomprise a wireless digital interface, especially a WIFI interfaceand/or a Bluetooth interface, and/or wherein the at least two probeinterfaces comprise an analog interface, especially a voltage interfaceand/or a current interface and/or a thermocouple interface. Asalternative or in addition, the multi probe measurement device maycomprise at least two probe interfaces of the same type.

The probe interfaces in the multi probe measurement device may compriseany type of interface that may be used to connect a measurement probe tothe multi probe measurement device.

The multi probe measurement device may therefore comprise any type ofanalog interfaces, e.g. for receiving voltage or current based signals.For such analog signals, the multi probe measurement device may furthercomprise respective analog-to-digital converters. These converters allowthe multi probe measurement device to digitize the analog values andprovide these via the data interface to the device that is connected tothe data interface.

The multi probe measurement device may also comprise a plurality ofdifferent digital probe interfaces, as shown above. Such interfaces mayrange from parallel or serial digital interfaces that receive rawmeasurement values to complex bus or network interfaces, like e.g. USB,Ethernet, CAN, FlexRay or the like. The multi probe measurement devicemay e.g. comprise a respective host unit, if necessary. The multi probemeasurement device may e.g. comprise a USB host, controller forrespective USB measurement probes. For Ethernet-based measurement probesthe multi probe measurement device may e.g. comprise a DHCP server orthe like. In any case, the multi probe measurement device may compriseany device that is necessary to provide data communication with therespective probe. Such devices may include controllers, transceivers andthe like.

The same applies to the possible digital wireless interfaces, like e.g.WIFI, Bluetooth, ZigBee or any other, also proprietary, interface.

It is further understood, that the processing unit may comprise aconversion element or function that converts the measurement valuesreceived via the probe interfaces into a data format that may betransmitted via the data interface.

In a possible embodiment, the data interface may comprise at least onedigital data channel and/or at least one analog data channel, andespecially one digital data channel and four analog data channels.

The digital channel of the data interface may be used to transmit therecorded measurement values to the device that is connected to the datainterface. The analog channels in contrast may serve as replacementchannels for the analog input channels of the device that is connectedto the data interface, e.g. the oscilloscope. This allows connecting allrequired measurement probes and cables at the multi probe measurementdevice instead of the device that is connected to the data interface.Therefore, the cabling effort is reduced.

The multi probe measurement device may as alternative compriserespective analog frontends that may be identical to the analogfrontends in the device that is connected to the data interface andprovide the analog signals in digitized format to the device that isconnected to the data interface.

In a possible embodiment, the multi probe measurement device maycomprise a trigger unit configured to output a trigger event signal viathe data interface if a predetermined condition is detected on one ofthe probe interfaces.

The multi probe measurement device may e.g. comprise a simple triggerunit that may provide the trigger event signal when a signal value ofthe recorded measurement values raises over a predetermined value. Thetrigger unit may however also be a complex trigger unit that allowsdefining complex triggering scenarios that comprise values of multiplemeasurement probes and e.g. specific time series of values.

It is understood, that in addition or as alternative an external triggersignal may be provided from the device that is connected to the datainterface to trigger the recording of measurement values in the multiprobe measurement device.

In a possible embodiment, the measurement data receiver may comprise amaster clock device that may be configured to generate a synchronizationmessage and provide the synchronization message via the data interfaceto the multi probe measurement device. In addition or as alternative,the synchronization message may conform to the LXI protocol, i.e. theLAN extension for Instrumentation.

The measurement data receiver and multi probe measurement devicetherefore operate timely synchronized. This allows the measurement datareceiver to process the measurement values recorded by the multi probemeasurement device in accordance with the respective measurement valuesrecorded in the measurement data receiver via the analog input channelsof the measurement data receiver.

The use of the LXI protocol may further lead to the measurement datareceiver and/or the multi probe measurement device comprising therespective web interface for configuration of the devices by the user.

In a possible embodiment, the measurement data receiver may comprise afirst number of analog input channels and a switching matrix. Further,the multi probe measurement device may comprise a second number ofanalog input channels. The switching matrix may be configured tocontrollably switch up to the first number of analog input channels ofthe measurement data receiver to the data interface for receiving analogsignals from the analog inputs of the multi probe measurement device.

With the help of the switching matrix, the measurement data receiver mayuse two different signal sources for high speed signal recording.

The measurement data receiver may e.g. use its own analog input channelsto perform high speed signal recording of analog signals. In this casethe respective measurement probes may be directly coupled to themeasurement data receiver.

The measurement data receiver may however also use the analog inputchannels of the multi probe measurement device as a kind of remotemeasurement channels. The multi probe measurement device may e.g.comprise respective connectors for the high speed measurement probesthat are usually connected to the measurement data receiver and directlyconnect these probes to the analog input channels of the data interface.The analog signals are therefore directly provided to the measurementdata receiver from the multi probe measurement device. In themeasurement data receiver the switching matrix will couple the analoginput channels of the data interface with the analog frontends of themeasurement data receiver. There the analog signals may be processed asif they were directly recorded via the analog inputs of the measurementdata receiver.

In a possible embodiment, the measurement data receiver may comprise acontrol unit coupled to the data interface and configured toautomatically identify the multi probe measurement device when the multiprobe measurement device is connected to the measurement data receivervia the data interface.

There may exist different types of multi probe measurement devices withdifferent configurations. Different multi probe measurement devices maye.g. comprise different probe interfaces and different data rates on thedata interface and the like. Such information may e.g. be stored in themeasurement data receiver and after identifying the respective multiprobe measurement device, the measurement data receiver may set therespective parameters.

In a possible embodiment, the multi probe measurement device may beconfigured to transmit information about measurement probes connected tothe multi probe measurement device via the data interface uponconnection of the multi probe measurement device to the measurement datareceiver.

If the multi probe measurement device transmits the information aboutthe measurement probes that are connected to the multi probe measurementdevice, the measurement data receiver may automatically process thereceived measurement values accordingly. The measurement data receivermay e.g. know that a measurement probe comprises a temperature sensorand automatically display the measurement values as temperature values.For other types of measurement values the measurement data receiver mayalso automatically set the unit and e.g. a value range and the like.

In a possible embodiment, the measurement data receiver may comprise apower supply that is configured to supply the multi probe measurementdevice with electrical power via the data interface.

The power supply may e.g. be a Power over Ethernet power supply, a Powerover USB power supply, or any other wired power supply, or a wirelesspower supply, like e.g. an inductive power supply.

The method of the present invention may in addition or as alternative tothe above also comprise acquiring, e.g. measuring, a number, i.e. one ormore, of first measurement values or values in view of a common baseparameter, and acquiring, e.g. measuring, a number, i.e. one or more, ofsecond measurement values or values in view of a common base parameter.The common base parameter may e.g. be time. The common base parametermay therefore be a time base.

The first measurement value may e.g. be an analog signal, especially ahigh frequency signal or a signal in a digital or analog circuit, thatmay be acquired via an analog channel of the measurement data receiver,e.g. an oscilloscope. The second measurement value may e.g. be a slowchanging signal, like e.g. the signal of a temperature sensor or anyother of the above mentioned sensors. The term “high frequency” firstmeasurement value in this regard may refer to a frequency that is higherthan the rate of change or frequency of the second measurement value. Itis understood, that the second measurement value may e.g. beindependently acquired. In addition, the first measurement values andthe second measurement values may e.g. be acquired with differentsampling rates or bandwidths. The sampling rate or bandwidth of thefirst measurement values may e.g. be higher than the sampling rate orbandwidth of the second measurement values. Especially, if the samplingrate or bandwidth of the second measurement values is smaller or lowerthan the sampling rate or bandwidth of the first measurement values, thesecond measurement values may be interpolated to match the sampling rateor bandwidth of time base of the first measurement values.

Further, the first measurement values may e.g. be acquired via analogchannels of the measurement data receiver, e.g. an oscilloscope, e.g. asdescribed above. The second measurement values may e.g. be acquired viaa multi probe measurement device, as for example described above. Ameasurement memory may be provided and the first measurement values andthe second measurement values may be stored in that measurement memory.

The first measurement values and the second measurement values togetherwith the base parameter form a triple and may be stored in theacquisition memory as such a triple. This simplifies later analysis ofthe measured values. A plurality of such triples may e.g. form a traceor waveform.

It is clear, that both the first measurement values and the secondmeasurement values may be displayed separately, e.g. on a screen of themeasurement data receiver.

In addition, one of the second measurement values may e.g. be convertedinto a color or color code for the first measurement values. In anexemplary application, that second measurement value may e.g. comprise atemperature of an electronic circuit. The first measurement values maye.g. be a signal in that electronic circuit. If the second measurementvalue is converted into a color, the first measurement values of therespective trace may e.g. be color coded accordingly. If for example attime 0 the value of the respective one of the second measurement valuescorresponds to color blue and at time X corresponds to color red, itwill be immediately understandable to any user that the respectivevalues of the first measurement values have been recorded at highertemperatures. The same is e.g. possible for pressure, acceleration orany other parameter or value that, may be acquired as second measurementvalue. Instead of a color coding, the above may also be applied inanalogy to brightness. This means that the first measurement values mayvaried in brightness on a display of the measurement data receiver basedon the values of the respective second measurement value. A combinationof color and brightness modulation is also possible. The same appliese.g. to the thickness of the lines that represent the first measurementvalues.

The conversion of the second measurement values into a color of colorcode may e.g. be performed via a respective formula or via a look-uptable.

It is understood, that the measurement data receiver of the measuringsystem may comprise a processor or processing unit that may beconfigured to perform the above described functions.

The method of the present invention may in addition or as alternative tothe above also comprise acquiring, e.g. measuring, a number, i.e. one ormore, of first measurement values in view of a common base parameter,and acquiring, e.g. measuring, a number, i.e. one or more, of secondmeasurement values or values in view of a common base parameter. Thecommon base parameter may e.g. be time. The common base parameter maytherefore be a time base.

The first measurement value may e.g. be an analog signal, especially ahigh frequency signal or a signal in a digital or analog circuit, thatmay be acquired via an analog channel of the measurement data receiver,e.g. an oscilloscope. The second measurement value may e.g. be a slowchanging signal, like e.g. the signal of a temperature sensor or anyother of the above mentioned sensors. The term “high frequency” firstmeasurement value in this regard may refer to a frequency that is higherthan the rate of change or frequency of the second measurement value. Itis understood, that the second measurement value may e.g. beindependently acquired. In addition, the first measurement values andthe second measurement values may e.g. be acquired with differentsampling rates or bandwidths. The sampling rate or bandwidth of thefirst measurement values may e.g. be higher than the sampling rate orbandwidth of the second measurement values. Especially, if the samplingrate or bandwidth of the second measurement values is smaller or lowerthan the sampling rate or bandwidth of the first measurement values, thesecond measurement values may be interpolated to match the sampling rateor bandwidth or time base of the first measurement values.

Further, the first measurement values may e.g. be acquired via analogchannels of the measurement data receiver, e.g. an oscilloscope, e.g. asdescribed above. The second measurement values may e.g. be acquired viaa multi probe measurement device, as for example described above.

Further, one or more characteristic values of the first measurementparameters may e.g. be determined. Such characteristic values may e.g.comprise the period, the frequency, the mean value, a median value, thestandard deviation or any other characteristic value.

A measurement memory may be provided and the first measurement valuesand/or the respective characteristic values may be stored in themeasurement memory together with the second measurement values.

It is understood, that a respective processing unit may be provided e.g.in the measurement data receiver to determine the characteristic values.Such a processing unit may e.g. comprise a processor, an ASIC, a FPGA, adigital signal processor. If a processor is involved an instructionmemory may be provided that comprises the respective instructions thatwhen executed by the processor perform the required functions.

The first measurement values, or the respective characteristic values,and the second measurement values together with the base parameter forma triple and may be stored in the acquisition memory as such a triple.This simplifies later analysis of the measured values. A plurality ofsuch triples may e.g. form a trace or waveform.

It is understood, that the characteristic values may e.g. be determinednot only based on a single value of the respective one of the firstmeasurement values but on a sequence of respective values or on a tracethat comprises the values of the first measurement values and the secondmeasurement values.

In addition, the characteristic values may also be determined based on aplurality of traces, e.g. independent or consecutive measurements of thesame first measurement values.

It is further possible, that not all first measurement values and allsecond measurement parameters are stored in the memory as traces. It isfor example possible that the first measurement values and/or the secondmeasurement values are only stored if a change of the respective valueoccurs. A respective time stamp may also be stored. This facilitatese.g. long running or long term analysis and reduces the required amountof memory.

It is clear, that both the first measurement values, the characteristicvalues and/or the second measurement values may be displayed separately,e.g. on a screen of the measurement data receiver.

In addition, the characteristic values may e.g. be displayed over one ofthe second measurement values. For example, a period or frequency may bedisplayed over temperature, humidity, pressure or any other one of thesecond measurement values. It may also be possible to display thecharacteristic values in parallel over different second measurementvalues. The period or frequency may e.g. be displayed over multipletemperatures measured at different spots on a circuit board.

It is understood, that the measurement data receiver of the measuringsystem may comprise a processor or processing unit that may beconfigured to perform the above described functions.

As already indicated above, the measurement data receiver of themeasuring system may comprise analog input channels. At least one of theanalog input channels may e.g. comprise a channel trigger unit that maygenerate a channel trigger signal or event upon a respective triggerevent, e.g. a respective signal value of a measured voltage or current.The trigger signal may e.g. be an analog or digital signal. It isunderstood, that the analog input channels may also compriseanalog-to-digital converters and any other required electric orelectronic element.

In addition, the measurement data receiver may comprise a secondinterface for data acquisition, like e.g. the data interface asdescribed above, that may comprise a signal analyzer that generates astate change signal upon detection of a predetermined condition in arespective one of the second measurement values.

Further, a combiner may be provided that combines the channel triggersignal with the state change signal into a combined state signal. Thecombiner may e.g. comprise an AND gate or a respective function in afirmware or software. The combiner may e.g. be coupled to the analoginput channels and the state change signal may trigger signal capturingor acquisition by the analog input channels. In addition, the statechange signal may also trigger signal acquisition by the secondinterface.

It is understood, that the number, i.e. one or more, of firstmeasurement values and a number, i.e. one or more, of second measurementvalues or values may be acquired by the measurement data receiver inview of a common base parameter. The common base may e.g. be time. Thecommon base parameter may therefore be a time base.

The first measurement value may e.g. be an analog signal, especially ahigh frequency signal or a signal in a digital or analog circuit, thatmay be acquired via an analog channel of the oscilloscope. The secondmeasurement value may e.g. be a slow changing signal, like e.g. thesignal of a temperature sensor or any other of the above mentionedsensors. The term “high frequency” first measurement value in thisregard may refer to a frequency that is higher than the rate of changeor frequency of the second measurement value. It is understood, that thesecond measurement value may e.g. be independently acquired. Inaddition, the first measurement values and the second measurement valuesmay e.g. be acquired with different sampling rates or bandwidths. Thesampling rate or bandwidth of the first measurement values may e.g. behigher than the sampling rate or bandwidth of the second measurementvalues. Especially, if the sampling rate or bandwidth of the secondmeasurement values is smaller or lower than the sampling rate orbandwidth of the first measurement values, the second measurement valuesmay be interpolated to match the sampling rate or bandwidth or the timebase of the first measurement values.

Further, the first measurement values may e.g. be acquired via analogchannels of the measurement data receiver, e.g. as described above. Thesecond measurement values may e.g. be acquired via a multi probemeasurement device, as for example described above.

The first measurement values and the second measurement values togetherwith the base parameter form a triple and may be stored in theacquisition memory as such a triple. This simplifies later analysis ofthe measured values. A plurality of such triples may e.g. form a traceor waveform.

The signal analyzer may e.g. be configured to perform complex signalanalysis to generate the state change signal. The signal analyzer maye.g. compare an input value, e.g. a value acquired via a respectiveanalog input channel, with a threshold value or range and generate thestate change signal if the measured value is either higher or lower thanthe respective threshold value or is within or without the thresholdrange. Other possible analysis comprise analyzing the transient behaviorof the second measurement values, calculating the derivative of thesecond measurement values, calculating the reciprocal of the secondmeasurement values, integrating the second measurement values, delayingthe second measurement values prior to performing any analysis,performing an automatic threshold estimation and an automatic rangeestimation.

It is understood, that the oscilloscope of the measuring system maycomprise a processor or processing unit that may be configured toperform the above described functions.

BRIEF DESCRIPTION OF THE DRAWINGS

For a more complete understanding of the present invention andadvantages thereof, reference is now made to the following descriptiontaken in conjunction with the accompanying drawings. The invention isexplained in more detail below using exemplary embodiments which arespecified in the schematic figures of the drawings, in which:

FIG. 1 shows a block diagram of an embodiment of a measuring systemaccording to the present invention;

FIG. 2 shows a block diagram of an embodiment of a measuring systemaccording to the present invention;

FIG. 3 shows a block diagram of an embodiment of a measuring systemaccording to the present invention; and

FIG. 4 shows a flow diagram of an embodiment of a method according tothe present invention.

The appended drawings are intended to provide further understanding ofthe embodiments of the invention. They illustrate embodiments and, inconjunction with the description, help to explain principles andconcepts of the invention. Other embodiments and many of the advantagesmentioned become apparent in view of the drawings. The elements in thedrawings are not necessarily shown to scale.

In the drawings, like, functionally equivalent and identically operatingelements, features and components are provided with like reference signsin each case, unless stated otherwise.

DETAILED DESCRIPTION OF THE DRAWINGS

FIG. 1 shows a block diagram of an embodiment of a measuring system 100.The measuring system 100 comprises a multi probe measurement device 101that is coupled to a measurement data receiver 110.

The multi probe measurement device 101 comprises two probe interfaces105, 106. The probe interfaces 105, 106 are each coupled with onemeasurement probe 102, 103. It is understood, that the number of twoprobe interfaces 105, 106 is just exemplary and that each probeinterfaces 105, 106 may be coupled to more than one measurement probe102, 103.

The probe interfaces 105, 106 are coupled to a processing unit 107. Theprocessing unit 107 is further coupled to a data interface 104. The datainterface 104 of the multi probe measurement device 101 is coupled to adata interface 111 of the measurement data receiver 110.

During operating the processing unit 107 records measurement values 103via the probe interfaces 105, 106 from the measurement probes 102, 103.The measurement probe 102, 103 may e.g. comprise temperature sensors,acceleration sensors, light intensity sensors, color sensors, viscositysensors for liquids and gas sensors or any other type of sensor.

The processing unit 107 further provides the recorded measurement values108 to the measurement data receiver 110 via the data interface 104 forfurther processing. The measurement data receiver 110 may e.g. be anoscilloscope that may acquire analog signals via analog measurementchannels 112, 113, 114, 115. It is understood, that the analogmeasurement channels 112, 113, 114, 115 may e.g. comprise high speedand/or high bandwidth analog signal acquisition circuitry. Suchcircuitry may e.g. comprise the analog stage as it is usuallyencountered in oscilloscopes and may e.g. comprise filters, attenuators,impedance matching circuitry and the like.

In contrast to the analog measurement channels 112, 113, 114, 115, theprobe interfaces 105, 106 and the processing unit 107 may e.g. beconfigured to acquire the measurement values 108 with a lower samplingrate and/or bandwidth. This allows using simpler and less complexhardware. The probe interfaces 105, 106 may e.g. comprise wired digitaldata interfaces, wireless digital interfaces and/or analog interfaces.

The wired digital data interface may for example comprise at least oneof a USB interface, a LAN interface, a CAN interface, a CAN-FD(CAN-Flexible Data Rate) interface, a LIN interface, a FlexRayinterface, an I2C interface, or a SENT interface. The wireless digitalinterface may e.g. comprise at least one of a WIFI interface, aBluetooth interface, a ZigBee interface or the like. The analoginterface may e.g. comprise a voltage interface or a current interface,like e.g. a thermocouple interface.

The multi probe measurement device 101 therefore provides themeasurement data receiver 110 with additional information that may helpin analyzing the analog signals acquired via the analog measurementchannels 112, 113, 114, 115.

It is understood, that the measurement data receiver 110 may e.g.comprise a display device for showing at least the analog signals andoptionally also the measurement values 108 to a user. Instead of showingthe measurement values 108 to the user, the measurement values 108 mayalso be used to adapt the display of the analog signals.

It is for example possible to show the traces or waveforms of the analogsignals as colored traces and change the color of the traces accordingto measurement values 108. The measurement values 108 may e.g. refer totemperature, acceleration or the like. For example a low temperature maybe displayed as blue color of a trace and high temperature may bedisplayed as red color of the respective trace. It is e.g. also possibleto provide a three dimensional view of the trace, where the height ofthe trace is modulated by the respective measurement values 108.

The measurement data receiver 110 may e.g. be capable of performingcomplex analysis function on the analog signals and e.g. determineperiod or a frequency or other characteristic values of the analogsignals. With the multi probe measurement device 101 it is thereforepossible to display such characteristic values over the measurementvalues 108 or to use the measurement values 108 to modulate e.g. thecolor or height of a trace of the characteristic values, as describedabove for the analog signals. It is understood, that to this end, themeasurement data receiver 110 may comprise respective signal processingdevices, like e.g. a processor with a respective firmware of software, adigital signal processor, respectively configured FPGAs or CPLDs or thelike.

Further, the measurement data receiver 110 may e.g. use the measurementvalues 108 as a trigger source. This means that the measurement datareceiver 110 may monitor the measurement values 108 and startmeasurements when certain predetermined conditions are met by themeasurement values 108. This trigger generation may also be combinedwith the trigger generation via the analog measurement channels 112,113, 114, 115.

In some embodiments, the measurement data receiver 110 shown in FIG. 1may further include a measurement memory 141, and the measurement values108 may be stored in the measurement memory 141.

In some embodiments, the measurement data receiver 110 shown in FIG. 1may include a master clock device 142 configured to generate asynchronization message and provide the synchronization message via thedata interface 104 to the multi probe measurement device 101. Inaddition or as alternative, the synchronization message may conform tothe LXI protocol, i.e. the LAN extension for Instrumentation.

In some embodiments, the measurement data receiver 110 shown in FIG. 1may include a power supply 143 configured to supply the multi probemeasurement device 101 with electrical power via the data interface 104.

It is further understood, that the multi probe measurement device 101and the measurement data receiver 110 may synchronize with each other.The measurement data receiver 110 may e.g. execute a function like amaster in a bus system and indicate to the multi probe measurementdevice 101 when to start and stop measurements. Further synchronizationvia time stamps will be described in further detail with regard to FIG.2 .

FIG. 2 shows a block diagram of an embodiment of a measuring system 200.The measuring system 200 is based on the measuring system 100.Therefore, the measuring system 200 comprises a multi probe measurementdevice 201 that is coupled via the data interface 204 to the datainterface 211 of the measurement data receiver 210. It is understood,that the above explanations regarding the measuring system 100 alsofully apply to the measuring system 200.

In addition to the processing unit 207, the multi probe measurementdevice 201 comprises a timer 220. The timer 220 provides time values ortime stamps 221 to the processing unit 207. The processing unit 207 maytherefore add the time stamps 221 to the measurement values 208 andprovide the time stamped measurement values 208 to the measurement datareceiver 210. The measurement data receiver 210 may also comprise atimer for providing time stamps to the acquired analog signals.Therefore, the measurement values 208 and the acquired analog signalsmay easily be aligned in time for further processing. It is understood,that the multi probe measurement device 201 and the measurement datareceiver 210 may perform a clock synchronization via the data interface204 and the data interface 211. Any one of the two may perform the roleof a clock master for such a clock synchronization.

The multi probe measurement device 201 in addition comprises a triggerunit 222. The trigger unit 222 may e.g. analyze the measurement values208 and provide a respective trigger signal 223 to the processing unit207 that initiates the acquisition of the measurement values 208 in theprocessing unit 207. In addition, it is understood, that a triggersignal may also be provided by the measurement data receiver 210 via thedata interface 211.

In some embodiments, the measurement data receiver 210 shown in FIG. 2may further include a measurement memory 241, and the measurement values208 may be stored in the measurement memory 241.

In some embodiments, the measurement data receiver 210 shown in FIG. 2may include a master clock device 242 that may be configured to generatea synchronization message and provide the synchronization message viathe data interface 204 to the multi probe measurement device 201. Inaddition or as alternative, the synchronization message may conform tothe LXI protocol, i.e. the LAN extension for Instrumentation.

In some embodiments, the measurement data receiver 210 shown in FIG. 2may include a power supply 243 configured to supply the multi probemeasurement device 201 with electrical power via the data interface 204.

FIG. 3 shows a block diagram of an embodiment of a measuring system 300.The measuring system 300 is based on the measuring system 100.Therefore, the measuring system 300 also comprises the multi probemeasurement device 301 that is coupled via the data interface 304 to thedata interface 311 of the measurement data receiver 310. The multi probemeasurement device 301 comprises the two probe interfaces 305, 306 thatare coupled to measurement probes 302, 303 for acquiring measurementvalues 308. The processing unit 307 then provides the measurement values308 via the data interface 304 to the measurement data receiver 310.

The data interface 304 and the data interface 311 are coupled to eachother by a digital data channel 330. In addition a number, i.e. one ormore, of analog data channels 331 are provided. In the measuring system300 the measurement probes 302, 303 may comprise analog measurementprobes that allow acquiring analog signals the same way that the analogmeasurement channels 312, 313, 314, 315 of the measurement data receiver310 may acquire such analog signals. As alternative to the measurementprobes 302, 303, the multi probe measurement device 301 may compriserespective analog measurement channels.

The acquired analog signals may then be provided to the measurement datareceiver 310 via the analog data channels 331. In the measurement datareceiver 310 a switching matrix 332 is provided. The switching matrix332 serves for selecting a signal source for a following signalprocessing stage. The switching matrix 332 may select to either providethe signals acquired one of the analog measurement channels 312, 313,314, 315 to the following signal processing stage or the respectivesignal received via one of the analog data channels 331. In themeasurement data receiver 310 the switching matrix 332 is shown ascomprising four switching elements 333, 334, 335, 336. Instead of fourswitching elements 333, 334, 335, 336 less switching elements could alsobe provided for only some of the analog measurement channels 112, 113,114, 115.

For sake of clarity in the following description of the method basedFIG. 4 the reference signs used above in the description of apparatusbased FIGS. 1-3 will be maintained.

FIG. 4 shows a flow diagram of a method for measuring electricalsignals. The method comprises coupling S1 a multi probe measurementdevice 101, 201, 301 to a measurement data receiver 110, 210, 310 withanalog measurement channels 112, 113, 114, 115, 212, 213, 214, 215, 312,313, 314, 315 via a data interface 104, 204, 304, 111, 211, 311, 311,connecting S2 at least one measurement probe 102, 103, 202, 203, 302,303 to the multi probe measurement device 101, 201, 301, measuring S3analog signals with the measurement data receiver 110, 210, 310,recording S4 measurement values 108, 208, 306 with the multi probemeasurement device 101, 201, 301, and providing S5 the recordedmeasurement values 108, 208, 308 from the multi probe measurement device101, 201, 301 to the measurement data receiver 110, 210, 310 via thedata interface 104, 204, 304.

Connecting S2 the at least one measurement probe 102, 103, 202, 203,302, 303 may e.g. be performed via a wired digital data interface,especially a USB interface and/or a LAN interface and/or a CAN interfaceand/or a CAN-FD interface and/or a LIN interface and/or a FlexRayinterface and/or an I2C interface and/or a SENT interface, and/or via awireless digital interface, especially a WIFI interface and/or aBluetooth interface, and/or via an analog interface, especially avoltage interface and/or a current interface and/or a thermocoupleinterface.

The method may further comprise timely synchronizing the measurement ofthe analog signals and the recording of the measurement values108/208/308.

Although specific embodiments have been illustrated and describedherein, it will be appreciated by those of ordinary skill in the artthat a variety of alternate and/or equivalent implementations exist. Itshould be appreciated that the exemplary embodiment or exemplaryembodiments are only examples, and are not intended to limit the scope,applicability, or configuration in any way. Rather, the foregoingsummary and detailed description will provide those skilled in the artwith a convenient road map for implementing at least one exemplaryembodiment, it being understood that various changes may be made in thefunction and arrangement of elements described in an exemplaryembodiment without departing from the scope as set forth in the appendedclaims and their legal equivalents. Generally, this application isintended to cover any adaptations or variations of the specificembodiments discussed herein.

In the foregoing detailed description, various features are groupedtogether in one or more examples or examples for the purpose ofstreamlining the disclosure. It is understood that the above descriptionis intended to be illustrative, and not restrictive. It is intended tocover all alternatives, modifications and equivalents as may be includedwithin the scope of the invention. Many other examples will be apparentto one skilled in the art upon reviewing the above specification.

Specific nomenclature used in the foregoing specification is used toprovide a thorough understanding of the invention. However, it will beapparent to one skilled in the art in light of the specificationprovided herein that the specific details are not required in order topractice the invention. Thus, the foregoing descriptions of specificembodiments of the present invention are presented for purposes ofillustration and description. They are not intended to be exhaustive orto limit the invention to the precise forms disclosed; obviously manymodifications and variations are possible in view of the aboveteachings. The embodiments were chosen and described in order to bestexplain the principles of the invention and its practical applications,to thereby enable others skilled in the art to best utilize theinvention and various embodiments with various modifications as aresuited to the particular use contemplated. Throughout the specification,the terms “including” and “in which” are used as the plain-Englishequivalents of the respective terms “comprising” and “wherein,”respectively. Moreover, the terms “first,” “second,” and “third,” etc.,are used merely as labels, and are not intended to impose numericalrequirements on or to establish a certain ranking of importance of theirobjects.

LIST OF REFERENCE SIGNS

-   -   100, 200, 300 measuring system    -   101, 201, 301 multi probe measurement device    -   102, 103, 202, 203, 302, 303 measurement probe    -   104, 204, 304 data interface    -   105, 106, 205, 206, 305, 306 probe interface    -   107, 207, 307 processing unit    -   108, 208, 308 measurement value    -   110, 210, 310 measurement data receiver    -   111, 211, 311, 311 data interface    -   112, 113, 114, 115 analog measurement channel    -   212, 213, 214, 215 analog measurement channel    -   312, 313, 314, 315 analog measurement channel    -   141, 241 measurement memory    -   142, 242 master clock device    -   143 243 power supply    -   220 timer    -   221 time stamp    -   222 trigger unit    -   223 trigger signal    -   330 digital data channel    -   331 analog data channel    -   332 switching matrix    -   333, 334, 335, 336 switching element

The invention claimed is:
 1. A measuring system for measuring signalswith multiple measurement probes, the measuring system comprising: ameasurement data receiver comprising analog input channels for recordingmeasured analog signals of an external device under test, multiplemeasurement probes which are configured to measure signals of theexternal device under test, which are different to the analog signals, amulti probe measurement device coupled to the measurement data receiverand comprising: at least two probe interfaces which are connectable orconnected to corresponding ones of the measurement probes and which areconfigured to receive the measured signals, a processing unit coupled tothe at least two probe interfaces and configured to record measurementvalues contained in the measured signals, wherein the processing unit isfurther coupled to the first data interface and is further configured toprovide the recorded measurement values to the measurement datareceiver, and wherein the multi probe measurement device in combinationwith the measurement data receiver are arranged and configured such toperform a timely aligned analysis or a correlated analysis of themeasured signals of the external device under test with the measuredanalog signals of the same device under test.
 2. The measuring system ofclaim 1, wherein the measurement data receiver comprising a first datainterface, and the multi probe measurement device comprising a seconddata interface coupled to the first data interface for coupling themulti probe measurement device to the measurement data receiver.
 3. Themeasuring system of claim 1, wherein the measuring system is configuredto analyze the signals measured by the measurement probes together withthe analog signals measured via the analog channels of the measurementdata receiver to perform an analysis of the respective device undertest.
 4. The measuring system of claim 1, wherein the multiplemeasurement probes comprise at least one of: a temperature sensor, anacceleration sensor, a light intensity sensor, a color sensor, aviscosity sensor for liquids, a gas sensor.
 5. The measuring systemaccording to claim 1, the multi probe measurement device comprising atimer coupled to the processing unit, wherein the processing unitprovides the recorded measurement values with a time stamp.
 6. Themeasuring system according to claim 1, wherein the processing unit ofthe multi probe measurement device receives a synchronization messagevia the data interface and configures the tinier according to thesynchronization message.
 7. The measuring system according to claim 1,wherein the at least two probe interfaces of the multi probe measurementdevice comprise a wired digital data interface, especially a USBinterface and/or a LAN interface and/or a CAN interface and/or a CAN-FDinterface and/or a LIN interface and/or a FlexRay interface and/or anI2C interface and/or a SENT interface, and/or wherein the at least twoprobe interfaces of the multi probe measurement device comprise awireless digital interface, especially a WIFI interface and/or aBluetooth interface, and/or wherein the at least two probe interfaces ofthe multi probe measurement device comprise an analog interface,especially a voltage interface and/or a current interface aid/or athermocouple interface; and/or wherein the multi probe measurementdevice comprises at least two probe interfaces of the same type.
 8. Themeasuring system according to claim 1, wherein the data interface of themulti probe measurement device comprises at least one digital datachannel and/or at least one analog data channel, and especially onedigital data channel and four analog data channels.
 9. The measuringsystem according to claim 1, the multi probe measurement devicecomprising a trigger unit that outputs a trigger event signal via thedata interface if a predetermined condition is detected on one of theprobe interfaces.
 10. The measuring system according to claim 1, whereinthe measurement data receiver comprises a master clock device thatgenerates a synchronization message and provide the synchronizationmessage via the data interface to the multi probe measurement device,especially wherein the synchronization message conforms to the LSIprotocol.
 11. The measuring system according to claim 1, wherein themeasurement data receiver comprises a first number of analog measurementchannels and a switching matrix, and wherein the multi probe measurementdevice comprises a second number of analog input channels, and whereinthe switching matrix controllably switches up to the first number ofanalog measurement channels of the measurement data receiver to the datainterface for receiving analog signals from the analog inputs of themulti probe measurement device.
 12. The measuring system according toclaim 1, wherein the measurement data receiver comprises a control unitcoupled to the data interface that automatically identifies the multiprobe measurement device when the multi probe measurement device isconnected to the measurement data receiver via the data interface. 13.The measuring system according to claim 1, wherein the multi probemeasurement device transmits information about measurement probesconnected to the multi probe measurement device via the data interfaceupon connection of the multi probe measurement device to the measurementdata receiver.
 14. The measuring system according to claim 1, whereinthe measurement data receiver comprises a power supply that supplies themulti probe measurement device with electrical power via the datainterface.
 15. The measuring system according to claim 1, wherein themeasurement data receiver comprises a first number of analog measurementchannels that acquire first measurement values, wherein the measurementdata receiver comprises a processor that determines a number ofcharacteristic values for the first measurement values.
 16. Themeasuring system according to claim 15, wherein the first measurementvalues are acquired according to a base parameter that is common betweenthe analog measurement channels and the measurement values recorded viathe at least two probe interfaces, especially wherein the common baseparameter comprises a common time base.
 17. The measuring systemaccording to claim 16, wherein the first measurement values and/or therespective characteristic values, and the second measurement valuestogether with the base parameter form a triple that is stored in themeasurement memory.
 18. The measuring system according to claim 15,wherein the characteristic values comprise a period and/or a frequencyand/or a mean value and/or a median value and/or a standard deviation.19. The measuring system according to claim 15, wherein the measurementdata receiver comprises a measurement memory that is coupled to theanalog measurement channels and the processor, wherein the firstmeasurement values and/or the respective characteristic values arestored in the measurement memory with the second measurement values. 20.A measuring system for measuring signals with multiple measurementprobes, the measuring system comprising: a measurement data receivercomprising analog input channels for recording measured analog signals,multiple measurement probes which are configured to measure signals,which are different to the analog signals, a multi probe measurementdevice coupled to the measurement data receiver and comprising: at leasttwo probe interfaces which are connectable or connected to correspondingones of the measurement probes and which are configured to receive themeasured signals, a processing unit coupled to the at least two probeinterfaces and configured to record measurement values contained in themeasured signals, wherein the processing unit is further coupled to thefirst data interface and is further configured to provide the recordedmeasurement values to the measurement data receiver, and wherein themulti probe measurement device is configured such to convert at leastone value contained in the measured signals and/or the measured analogsignals into a color or a color code.
 21. The measuring system of claim20, wherein the multiple measurement probes comprises a temperaturesensor for measuring the temperature of a device under test and whereinthe value of the measured analog signal refers to the temperature of thedevice under test.
 22. The measuring system of claim 20, wherein thevalue of the measured analog signals is a slow changing value of thedevice under test.
 23. A method for measuring electrical signals, themethod comprising: coupling the multi probe measurement device to ameasurement data receiver via a data interface, connecting at least onemeasurement probe to the multi probe measurement device, measuringanalog signals using the measurement data receiver, measuring signalswhich are different to the measured analog signals, using themeasurement probe connected to the multi probe measurement device,recording measurement values of the measured signals using the multiprobe measurement device, providing the recorded measurement values fromthe multi probe measurement device to the measurement data receiver viathe data interface, and performing a timely aligned analysis or acorrelated analysis of the measured signals with the measured analogsignals.
 24. The method according to claim 23, comprising timelysynchronizing the measurement of the analog signals and the recording ofthe measurement values.
 25. The method according to claim 23, whereinconnecting at least one measurement probe comprises connecting themeasurement probe via a wired digital data interface, especially a USBinterface and/or a LAN interface and/or a CAN interface and/or a CAN-FDinterface and/or a interface and/or a FlexRay interface and/or an I2Cinterface and/or a SENT interface, and/or via a wireless digitalinterface, especially a WWI interface and/or a Bluetooth interface,and/or via an analog interface, especially a voltage interface and/or acurrent interface and/or a thermocouple interface.
 26. The methodaccording to claim 23, wherein first measurement values are acquired viaa first number of analog measurement channels in the measurement datareceiver, and wherein a number of characteristic values is determinedfor the first measurement values.
 27. The method according to claim 26,wherein the first measurement values are acquired according to a baseparameter that is common between the analog measurement channels and themeasurement values recorded via the at least two probe interfaces,especially wherein the base parameter comprises a common time base. 28.The method according to claim 27, wherein the first measurement valuesand/or the respective characteristic values, and the second measurementvalues together with the base parameter form a triple that is stored inthe measurement memory.
 29. The method according to claim 26, whereinthe characteristic values comprise a period and/or a frequency and/or amean value and/or a median value and/or a standard deviation.
 30. Themethod according to claim 26, wherein the first measurement valuesand/or the respective characteristic values are stored in a measurementmemory of the measurement data receiver with the second measurementvalues.
 31. A method for measuring electrical signals, the methodcomprising: coupling the multi probe measurement device to a measurementdata receiver via a data interface, connecting at least one measurementprobe to the multi probe measurement device, measuring analog signalsusing the measurement data receiver, measuring signals which aredifferent to the measured analog signals, using the measurement probeconnected to the multi probe measurement device, recording measurementvalues of the measured signals using the multi probe measurement device,providing the recorded measurement values from the multi probemeasurement device to the measurement data receiver via the datainterface, performing a timely aligned analysis or a correlated analysisof the measured signals with the measured analog signals, and convertingat least one value contained in the measured signal and/or the measuredanalog signals into a color or a color code.